%0 Journal Article
%T Relaxation processes in the irradiated bipolar and MOS devices
%A Bogatyrev, Y.V.
%A Lastovski, S..
%A Ogorodnikov, D..
%A Ket’ko, A..
%A Kozlovski, V..
%K relaxation processes, condenser and transistor MOS structures, integrated circuit, bipolar transistor structures, radiation hardness, gamma radiation, electron radiation
%J Infocommunications and Radio Technologies
%D 2019
%N 2
%P 10
%I Federal State Educational Institution of Higher Education Sevastopol State University