Simferopol, Simferopol, Russian Federation
Simferopol, Simferopol, Russian Federation
Simferopol, Simferopol, Russian Federation
Simferopol, Simferopol, Russian Federation
In this paper the design of a coaxial resonant measuring converter with a shortening capacitance used to determine the electrophysical parameters of the constituent elements of archaeological objects is proposed. Based on the numerical model, the optimal geometric dimensions of the resonant sensor are determined. The analysis of the main characteristics of the measuring transducer is carried out. A number of experimental data were obtained confirming the applicability of the proposed technique.
archaeological object, microwave resonator, resonant measuring converter, aperture, conversion characteristic
1. V. L. Myts, Report on the security excavations of the Crimean Mountain Expedition of the IA Academy of Sciences of the Ukrainian SSR in 1984. Institute of Archeology of Crimea RAS, no. 1984/76, 1984. (In Russ.).
2. A. A. Schepinsky, Archaeological survey of the Kurtsovo-Sablovskaya valley in 1950, IADC, pp. 307-327, 1957. (In Russ.).
3. Yu. Ye. Gordienko, Microwave diagnostics of layered semiconductor materials: diss. ... doct. phys.-math. sci., Kharkov, KhIRE, 1984. (In Russ.).
4. V. N. Egorov, “Resonance methods for studying dielectrics at microwave frequencies,” Pribory i tekhnika eksperimenta, no. 2, pp. 5-38, 2007. (In Russ.).
5. L. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and Vijay K. Varadan Microwave Electronics Measurement and Materials Characterization, New York: John Wiley & Sons, 2004.
6. M. V. Detinko, Physical foundations of the non-destructive microwave resonator method for local control of the electrophysical parameters of semiconductors. Tomsk: Publishing House of Tomsk University, 1988. (In Russ.).
7. A. S. Zavyalov, Measurement of parameters of materials at microwave frequencies, Tomsk: Publishing House of TGU, 1985. (In Russ.).
8. A. A. Brandt, Investigation of dielectrics at superhigh frequencies. Moscow : Fizmatizdat, 1963. (In Russ.).
9. E. M. Gershenzon, “Methods for determining the parameters of semiconductors and semiconductor films on microwave,” Semiconductor devices and their application, iss. 23, pp. 3-48, 1970. (In Russ.).
10. Yu. Ye. Gordienko, “Resonator measuring transducers in the diagnostics of microlayered structures,” Radiotekhnika, iss. 100. pp. 253-260, 1996. (In Russ.).
11. A. A. Ryabukhin, Electrodynamic models of resonator sensors in microwave diagnostics of semiconductors: diss. ... cand. phys.-math. sci. Kharkov: KhNURE, 2002. (In Russ.).
12. Yu. Ye. Gordienko, “Measuring transducers for non-destructive testing of the electrical conductivity of films in epitaxial structures of the nn+ type,” Elektronnaya Tekhnika, ser. 8, iss. 9, pp. 112-117, 1974. (In Russ.).
13. S. Hong, J. Kim, W. Park, and K. Lee, “Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator,” Applied Physics Letters, vol. 80, no. 3, pp. 524-526, Jan. 2002, doi:https://doi.org/10.1063/1.1435068.
14. Yu. V. Medvedev, “Technique for non-destructive measurement of resistivity, thickness and lifetime of minor charge carriers over the area of epitaxial films,” Elektronnaya Tekhnika. Ser. 1. Microwave electronics, no. 10, pp. 50-54, 1984. (In Russ.).
15. A. Imtiaz and S. M. Anlage, “Effect of tip geometry on contrast and spatial resolution of the near-field microwave microscope,” Journal of Applied Physics, vol. 100, no. 4, p. 044304, Aug. 2006, doi:https://doi.org/10.1063/1.2234801.
16. Yu. E. Gordienko, “The contribution of oscillatory and radiative losses to the characteristics of microwave converters with a coaxial measuring aperture,” Radiotekhnika, no. 157, pp. 108-114, 2009. (In Russ.).
17. A. A. Kuraev, Electrodynamics and propagation of radio waves, Minsk: 2004. (In Russ.).
18. A. D. Grigoriev, Electrodynamics and microwave technology, Moscow: 1990. (In Russ.).
