INVESTIGATION OF AUNI/N-N+-GAN CRYSTALS OF SCHOTTKY DIODES BY ATOMIC FORCE MICROSCOPY
Abstract and keywords
Abstract (English):
The component of electrostatic field (E*) of periferia (El) was found by atomic force microscopy. The E* has a significant effect on the electrostatic system of AuNi / n-GaN Schottky contacts, that was experimentally confirmed.

Keywords:
gallium nitride, Schottky barrier, ohmic contact, work function, surface, KPFM, peripheral electric field
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References

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